This inventor holds 1 USPTO granted patent. Top assignee: International Business Machines Corporation. Active years: 2001.
Company Filing History:
Years Active: 2001
Title: The Innovations of Frederick G Adams
Introduction
Frederick G Adams is a notable inventor based in Spring Lake Heights, NJ (US). He has made significant contributions to the field of logic gate technology, particularly in fault identification through voltage potential signatures. His innovative approach has led to the development of a unique logic gate design that enhances testing capabilities.
Latest Patents
Adams holds a patent for a method titled "Fault identification by voltage potential signature." This invention features a logic gate that includes a sensing circuit connected to a test output and an internal node. The sensing circuit is designed to detect voltage levels on the internal node and output a corresponding signal. Notably, this sensing circuit is inactive during the normal operation of the logic gate and consists of a single FET directly linked to both the internal node and the test output. Additionally, the logic gate incorporates a pre-charge circuit that prepares the test output to a specific voltage level before testing. This design can be utilized in integrated circuit (IC) chips, where multiple logic gates can share sensing circuits for enhanced testing efficiency.
Career Highlights
Frederick G Adams is associated with the International Business Machines Corporation (IBM), where he has contributed to various projects and innovations. His work has focused on improving the reliability and functionality of electronic components, particularly in the realm of logic gates.
Collaborations
Throughout his career, Adams has collaborated with notable colleagues, including Robert Dean Adams and Edmond S Cooley. These partnerships have fostered a creative environment that has led to advancements in technology and innovation.
Conclusion
Frederick G Adams is a distinguished inventor whose work in logic gate technology has paved the way for improved fault identification methods. His patent reflects a commitment to innovation and excellence in the field of electronics.
