International Business Machines Corporation

Frederick G Adams

Robert Dean Adams

Edmond S Cooley

A logic gate is provided that comprises a sensing circuit coupled to a test output and to an internal node of the logic gate. The sensing circuit is adapted to sense a voltage on the internal node and to output a signal indicating a level of the voltage. The sensing circuit is not used during normal operation of the logic gate and preferably comprises only a single FET that is directly coupled to both the internal node and to the test output. The logic gate also preferably comprises a pre-charge circuit for pre-charging the test output to a predetermined voltage level prior to testing. An IC chip may be formed from a plurality of the logic gates wherein each logic gate comprises a sensing circuit coupled to a test output and to an internal node of the logic gate. Each sensing circuit may be coupled to the same test output or to a unique test output for the sensing circuit's logic gate. The sensing circuits are not used during normal operation of the IC chip.

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Spring Lake Heights, NJ, United States of America

Frederick G Adams