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Title: Franz X Kaertner: Innovator in Integrated Optical Technologies
Introduction
Franz X Kaertner is a prominent inventor based in Hamburg, Germany. He is known for his groundbreaking work in the field of integrated optical technologies. His innovative contributions have significantly advanced the capabilities of optoelectronic devices.
Latest Patents
Franz X Kaertner holds a patent for an "Integrated Optical Field Sampling Platform." This invention focuses on an all-on-chip, optoelectronic device designed for sampling arbitrary, low-energy, near-infrared waveforms under ambient conditions. The solid-state integrated detector utilizes optical-field-driven electron emission from resonant nanoantennas, achieving petahertz-level switching speeds by generating on-chip attosecond electron bursts. Additionally, the patent discloses a cross-correlation technique based on the perturbation of local electron field emission rates, allowing for the full characterization of arbitrary electric fields down to 1 femtojoule and/or on the order of 500 kV/m, using plasmonic nanoantennas.
Career Highlights
Throughout his career, Franz X Kaertner has worked with prestigious institutions such as the Massachusetts Institute of Technology and the University of California. His work has been instrumental in pushing the boundaries of optical technology and its applications.
Collaborations
Franz has collaborated with notable colleagues, including Marco Turchetti and Mina Bionta. Their joint efforts have contributed to the advancement of research in integrated optical systems.
Conclusion
Franz X Kaertner's innovative work in integrated optical technologies has made a significant impact on the field. His contributions continue to inspire future advancements in optoelectronic devices.