Frank Richter

Title: Frank Richter: Innovator in Noncontact Measurement Technology

Introduction

Frank Richter is a notable inventor based in Lichtenfels, Germany. He has made significant contributions to the field of measurement technology, particularly in the noncontact determination of edge profiles in thin disk-shaped objects. His innovative approach has implications for various industries, including semiconductor manufacturing.

Latest Patents

Richter holds a patent for a "Device for noncontact determination of edge profile at a thin disk-shaped object." This device is designed to accurately determine the edge profile of semiconductor wafers without interference from specular reflections. The technology employs multiple laser radiation sources that emit line-shaped light bundles, arranged coplanar in a measurement plane. This setup allows for precise measurements by capturing scattered light from the object’s edge region.

Career Highlights

Richter is currently associated with Kocos Automation GmbH, where he continues to develop and refine innovative measurement solutions. His work has been instrumental in advancing the capabilities of noncontact measurement technologies, enhancing the accuracy and efficiency of edge profile determination.

Collaborations

Richter collaborates with talented professionals such as Axel Gaglin and Thomas Becker, contributing to a dynamic team focused on innovation in automation and measurement technologies.

Conclusion

Frank Richter's contributions to noncontact measurement technology exemplify the spirit of innovation in the field. His patent and ongoing work at Kocos Automation GmbH highlight the importance of precise measurement solutions in modern manufacturing processes.