The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 11, 2015

Filed:

Feb. 04, 2013
Applicant:

Kocos Automation Gmbh, Weimar, DE;

Inventors:

Axel Gaglin, Jena, DE;

Thomas Becker, Korbach, DE;

Frank Richter, Lichtenfells, DE;

Bernd Gey, Gera, DE;

Assignee:

KoCoS Automation GmbH, Weimar, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01); H04N 7/18 (2006.01); G01N 21/95 (2006.01); G01N 21/956 (2006.01); G01B 11/25 (2006.01);
U.S. Cl.
CPC ...
H04N 7/18 (2013.01); G01B 11/25 (2013.01); G01N 21/9503 (2013.01); G01N 21/956 (2013.01);
Abstract

A device for noncontact determination of the edge profile at a thin disk-shaped object helps determining the edge profile at semiconductor wafers in which exact image recording is not impaired by specular reflections of the edge profile. A plurality of light sources in the form of laser radiation sources each emitting a line-shaped light bundle are arranged so as to be coplanar in a common plane representing a measurement plane oriented orthogonal to a base plane of the object and are directed from different directions to a common intersection of the laser radiation sources in the edge region of the object. A light sheet is formed in the measurement plane and at least one base camera is directed in the base plane lateral to the measurement plane to capture scattered light proceeding from a light line generated by the light sheet when impinging the object edge region.


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