Toms River, NJ, United States of America

Frank J Flesch

This inventor holds 5 USPTO granted patents, plus 1 CIPO patent. Top assignees: Mcneil-Ppc, Inc., Chicopee. Active years: 1992-2003.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Frank J Flesch. Retrieved from https://idiyas.com/inventor/frank-j-flesch

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0


Average Co-Inventor Count = 3.9

ph-index = 4

Forward Citations = 75(Granted Patents)


Company Filing History:


Years Active: 1992-2003

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5 patents (USPTO):Explore Patents

Title: The Innovations of Frank J Flesch

Introduction

Frank J Flesch is a notable inventor based in Toms River, New Jersey. He has made significant contributions to the field of nonwoven fabrics, holding a total of five patents. His work focuses on improving absorbent characteristics in fabric technology.

Latest Patents

Among his latest patents is an absorbent nonwoven fabric that features improved absorbent characteristics. This innovative fabric incorporates three different fiber arrays that are interconnected, resulting in a unique fiber distribution. This advancement enhances the fabric's overall performance and utility.

Career Highlights

Throughout his career, Frank has worked with reputable companies such as McNeil-PPC, Inc. and Chicopee. His experience in these organizations has allowed him to refine his skills and contribute to the development of advanced fabric technologies.

Collaborations

Some of his notable coworkers include Susan Lynn Suehr and James E Knox. Their collaboration has likely played a role in the successful development of his innovative projects.

Conclusion

Frank J Flesch's contributions to the field of nonwoven fabrics demonstrate his commitment to innovation and improvement in fabric technology. His patents reflect a deep understanding of material science and a drive to enhance product performance.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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