Wetzlar, Germany

Frank Fiedler

This inventor holds 2 USPTO granted patents. Top assignees: Leica Microsystems Cms Gmbh, Leica Microsystems Wetzlar Gmbh. Active years: 2006-2009.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Frank Fiedler. Retrieved from https://idiyas.com/inventor/frank-fiedler

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 50.0

Average Co-Inventor Count = 1.3

ph-index = 2

Forward Citations = 13(Granted Patents)


Company Filing History:


Years Active: 2006-2009

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2 patents (USPTO):Explore Patents

Title: Frank Fiedler: Innovator in Microscopy Technology

Introduction

Frank Fiedler is a notable inventor based in Wetzlar, Germany. He has made significant contributions to the field of microscopy, holding 2 patents that showcase his innovative approach to enhancing microscopic technology. His work has been instrumental in advancing the capabilities of microscopes, making them more efficient and user-friendly.

Latest Patents

Fiedler's latest patents include a "Device and method for the configuration of a microscope." This invention features a partially or fully automated microscope that includes one or more configurable subassemblies. Each subassembly is equipped with at least one element that can be configured in various positions. A computer associated with the microscope, which has an input device and display, includes a database designed to store configurations of the element for the subassembly.

Another significant patent is the "Method and apparatus for coding live images in microscopy." This method allows for the recording of a complete image that depicts a portion of a microscopic preparation. A first coded complete image is generated and stored in a buffer memory. When a second complete image is recorded, only a part is processed and transmitted, corresponding to the offset of an X-Y stage. The coordinates of the portion of the second complete image, along with further control data, are transferred to a control data decoder, resulting in a correspondingly assembled and coded complete image.

Career Highlights

Throughout his career, Frank Fiedler has worked with prominent companies in the microscopy field. He has been associated with Leica Microsystems Wetzlar GmbH and Leica Microsystems CMS GmbH, where he has contributed to various projects and innovations. His expertise in microscopy has made him a valuable asset to these organizations.

Collaborations

Fiedler has collaborated with several professionals in his field, including his coworker Reiner Jung. Their joint efforts have led to advancements in microscopy technology and have furthered the development of innovative solutions.

Conclusion

Frank Fiedler's contributions to microscopy through his patents and career achievements highlight his role as an innovator in the field. His work continues to influence the development of advanced microscopic technologies.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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