The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 18, 2009
Filed:
Dec. 03, 2004
Applicants:
Frank Fiedler, Wetzlar, DE;
Reiner Jung, Langgoens, DE;
Inventors:
Frank Fiedler, Wetzlar, DE;
Reiner Jung, Langgoens, DE;
Assignee:
Leica Microsystems CMS GmbH, Wetzlar, DE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G05B 19/18 (2006.01); G02B 21/00 (2006.01); G02B 26/08 (2006.01); G06K 9/00 (2006.01); A61B 18/18 (2006.01);
U.S. Cl.
CPC ...
Abstract
A partially or fully automated microscope includes one or more configurable subassemb1y. Each subassembly has at least one element. The element can be configured in various positions. A computer, associated with the microscope and having an input device and display, also includes a database configured to store configurations of the element for the subassembly.
Fiedler, Frank. (2009). Device and method for the configuration of a microscope (U.S. Patent No. 7577484). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7577484
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile