Schortens, Germany

Frank Diehl

This inventor holds 5 USPTO granted patents and 1 published patent application and 3 EPO patents. Top assignee: Johns Hopkins University. Active years: 2014-2020.

USPTO Granted Patents = 5 

% Patents Active = 100.0

 

Average Co-Inventor Count = 3.5

ph-index = 3

Forward Citations = 54(Granted Patents)


Location History:

  • Schortens, DE (2014 - 2018)
  • Baltimore, MD (US) (2020)

Company Filing History:


Years Active: 2014-2020

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5 patents (USPTO):Explore Patents

Title: Frank Diehl: Innovator in DNA Analysis

Introduction

Frank Diehl is a notable inventor based in Schortens, Germany. He has made significant contributions to the field of DNA analysis, particularly through his innovative methods for beaming. With a total of 5 patents to his name, Diehl's work has advanced the understanding of DNA polymerases and their applications in cancer research.

Latest Patents

Diehl's latest patents focus on improvements in the basic method used for BEAMing. These enhancements increase sensitivity and improve the signal-to-noise ratio. As a result, they have enabled the determination of intrinsic error rates of various DNA polymerases. Furthermore, these advancements have facilitated the detection of rare and subtle mutations in DNA isolated from the plasma of cancer patients.

Career Highlights

Frank Diehl is affiliated with The Johns Hopkins University, where he continues to push the boundaries of research in molecular biology. His work has garnered attention for its potential impact on cancer diagnostics and treatment.

Collaborations

Diehl has collaborated with esteemed colleagues such as Kenneth W. Kinzler and Bert Vogelstein. Their joint efforts have contributed to significant advancements in the field of cancer research.

Conclusion

Frank Diehl's innovative contributions to DNA analysis through his patented methods have the potential to revolutionize cancer diagnostics. His work exemplifies the importance of research and collaboration in advancing medical science.

Profile summary based on public USPTO records.
Please report any incorrect information to [email protected]
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