This inventor holds 1 USPTO granted patent. Top assignee: Commissariat a L'energie Atomique Et Aux Energies Alternatives. Active years: 2011.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2011
Title: Innovator Francois Vacher and His Contributions to Non-Destructive Evaluation
Introduction
Francois Vacher is a notable inventor based in Toulouse, France. He has made significant contributions to the field of non-destructive evaluation, particularly in the assessment of defects in metallic objects. His innovative approach utilizes advanced technology to enhance the reliability and efficiency of defect detection.
Latest Patents
Francois Vacher holds a patent for a "Method and device for non-destructive evaluation of defects in a metallic object." This device employs eddy currents to evaluate defects without damaging the metallic object. It features a field emitter that generates an alternating electromagnetic field, along with a magnetoresistive sensor that detects the response signal from the induced eddy currents. The device includes a driving circuit, a detector, a filter, and a processor to analyze the filtered response signal and extract valuable information regarding defects.
Career Highlights
Vacher is associated with the Commissariat à l'Énergie Atomique et aux Énergies Alternatives, where he has been instrumental in advancing research in non-destructive testing methods. His work has contributed to improving safety and quality in various industries that rely on metallic components.
Collaborations
Francois Vacher has collaborated with esteemed colleagues such as Claude Fermon and Myriam Pannetier. Their combined expertise has fostered innovation and development in the field of non-destructive evaluation.
Conclusion
Francois Vacher's contributions to non-destructive evaluation through his patented technology exemplify the importance of innovation in ensuring the integrity of metallic structures. His work continues to influence the industry positively.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
