The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 22, 2011
Filed:
Feb. 24, 2006
Claude Fermon, Orsay, FR;
Myriam Pannetier, Bures sur Yvette, FR;
Nicolas Biziere, Rozay en Brie, FR;
Francois Vacher, Toulouse, FR;
Thierry Sollier, Antony, FR;
Claude Fermon, Orsay, FR;
Myriam Pannetier, Bures sur Yvette, FR;
Nicolas Biziere, Rozay en Brie, FR;
Francois Vacher, Toulouse, FR;
Thierry Sollier, Antony, FR;
Abstract
A device for non destructive evaluation of defects in a metallic object () by eddy currents, comprises a field emitter () for emitting an alternating electromagnetic field at a first frequency fi in the neighborhood of the metallic object (), and a magnetoresistive sensor () for detecting a response signal constituted by a return electromagnetic field which is re-emitted by eddy currents induced by the alternating electromagnetic field in the metallic object (). The device further comprises: a driving circuit () for driving the magnetoresistive sensor () by a current at a second frequency fc which is different from the first frequency fi, so that the magnetoresistive sensor () acts as an in situ modulator; a detector for detecting a response signal between the terminals of the magnetoresistive sensor (); a filter for filtering the response signal detected by the magnetoresistive sensor () to keep either the frequency sum (fi+fc) of the first and second frequencies or the frequency difference (fi−fc) of the first and second frequencies, and a processor for processing the filtered response signal and extract eddy current information on defects in the metallic object ().