Francis Scott Hoover

Title: The Innovations of Francis Scott Hoover

Introduction

Francis Scott Hoover is a notable inventor based in Houston, TX. He has made significant contributions to the field of calibration technology, particularly with his innovative patent that enhances measurement accuracy in devices.

Latest Patents

Hoover holds a patent for a technology titled "Multi-layer calibration for empirical overlay measurement." This invention involves determining overlay for a device using signals measured from the device and a signal response to overlay derived from multiple calibration targets. Each calibration target is designed similarly to the device but includes a known overlay shift. The calibration targets can be positioned in various locations, such as a scribe line or on a separate calibration wafer. The invention allows for precise measurement of overlay shifts in two orthogonal directions, improving the accuracy of device calibration.

Career Highlights

Francis Scott Hoover is currently employed at Onto Innovation Inc., where he continues to develop and refine innovative technologies. His work focuses on enhancing the performance and reliability of measurement systems in the semiconductor industry.

Collaborations

Hoover collaborates with talented colleagues, including Nigel P. Smith and Nicholas James Keller, who contribute to the advancement of their projects and innovations.

Conclusion

Francis Scott Hoover's contributions to calibration technology exemplify the impact of innovative thinking in the field. His patent demonstrates a commitment to improving measurement accuracy, which is crucial for the advancement of technology in various applications.