Francis M Taylor

Title: Innovations of Francis M Taylor

Introduction

Francis M Taylor is a notable inventor based in Xenia, OH (US), recognized for his contributions to optical measurement and ultrasonic inspection technologies. With a total of 5 patents, Taylor has made significant advancements in the field of engineering.

Latest Patents

One of his latest patents is a "Method and apparatus for optically measuring the distance to a workpiece." This invention involves sweeping the point of focus of an image through a measurement zone by rotating a plurality of convex specular surfaces. These surfaces are designed to approximate involute curves, allowing for precise distance measurement to a workpiece by monitoring the angular orientation of the surfaces. Another significant patent is the "Walking-gate ultrasonic flaw detector," which is a microprocessor-based system that detects fatigue cracks smaller than 0.030 inch under installed fasteners. This system utilizes a unique signal-processing method that enhances the detection of crack signals by analyzing the geometric information of the inspection zone.

Career Highlights

Throughout his career, Taylor has worked with various companies, including Systems Research Laboratories and Techmet Company. His work has focused on developing innovative solutions that improve measurement accuracy and inspection reliability.

Collaborations

Taylor has collaborated with notable individuals in his field, including Harry G Petrohilos and J Montgomery Rainey. These collaborations have contributed to the advancement of his inventions and the overall progress in the engineering sector.

Conclusion

Francis M Taylor's innovative work in optical measurement and ultrasonic inspection has significantly impacted the engineering field. His patents reflect a commitment to enhancing technology and improving safety in various applications.