The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 27, 1978
Filed:
Sep. 27, 1976
Francis M Taylor, Xenia, OH (US);
Systems Research Laboratories, Inc., Dayton, OH (US);
Abstract
An optical micrometer scans an article passing through its zone of measurement to provide a series of pulses representing the dimension of an article. Each new measurement is compared against a previous measurement, or an average of a predetermined number of previous measurements, and the difference is then compared to a previously established deviation limit. If this difference does not exceed the deviation limit, then the new measurement is transferred to the output of the circuit for utilization by the system, but if this difference exceeds the deviation limit, then the previous measurement signal will be transferred to the output. An alarm is provided whenever a predetermined number of new measurement signals outside the deviation limit occur within a certain number of measurement intervals.