Company Filing History:
2 out of 233 
1 out of 6 
1 out of 1 Years Active: 2010-2015
Title: Fong-Zhi Chen: Innovator in Vacuum Measurement and Optical Microscopy
Introduction
Fong-Zhi Chen is a prominent inventor based in Hsinchu, Taiwan. He has made significant contributions to the fields of vacuum measurement and optical microscopy, holding a total of four patents. His innovative work has advanced the technology used in various scientific and industrial applications.
Latest Patents
One of Fong-Zhi Chen's latest patents is the "Piezoelectric Vacuum Gauge and Measuring Method Thereof." This invention features a piezoelectric vacuum gauge that includes an actuator with a flexible portion, an actuating unit, a sensor unit, a signal input terminal, and a signal output terminal. The gauge operates by generating an external signal that prompts the actuating unit to vibrate, leading to a series of resonant motions that ultimately produce a detecting signal to calculate vacuum pressure values.
Another notable patent is the "Near-Field Scanning Optical Microscope." This microscope comprises a lighting component, a probe, and an ellipsoidal mirror. The lighting component emits light that is focused around the probe tip, allowing for the extraction of near-field light. The ellipsoidal mirror facilitates the scattering and reflection of this light, enhancing the capabilities of optical microscopy.
Career Highlights
Fong-Zhi Chen has worked with esteemed organizations such as the National Applied Research Laboratories and the Instrument Technology Research Center. His experience in these institutions has allowed him to collaborate on various innovative projects and contribute to advancements in technology.
Collaborations
Fong-Zhi Chen has collaborated with notable colleagues, including Chien-Shing Lee and Chia-Che Wu. Their teamwork has fostered an environment of innovation and creativity, leading to the development of groundbreaking technologies.
Conclusion
Fong-Zhi Chen's contributions to the fields of vacuum measurement and optical microscopy exemplify his dedication to innovation. His patents reflect a commitment to advancing technology and improving measurement techniques.