The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 05, 2013
Filed:
Jan. 28, 2011
Chih-wen Chen, Keelung, TW;
Jyh-rou Sze, Hsinchu, TW;
Din-ping Tsai, Taipei, TW;
Fong-zhi Chen, Hsinchu, TW;
Chih-Wen Chen, Keelung, TW;
Jyh-Rou Sze, Hsinchu, TW;
Din-Ping Tsai, Taipei, TW;
Fong-Zhi Chen, Hsinchu, TW;
National Applied Research Laboratories, Taipei, TW;
Abstract
A near-field scanning optical microscope is disclosed. The microscope includes a lighting component, a probe and an ellipsoidal mirror. The lighting component emits a light. The probe is disposed on one side of a testing sample, and the light is focused around a probe tip to draw the near-field light out. The ellipsoidal mirror has a first focal point and a second focal point, and the first focal point and the probe tip are disposed at the corresponding positions, and the near-field light drawn out from the probe tip is scattered from the first focal point inside the ellipsoidal mirror, and reflected and passed through the second focal point.