Carrick on Shannon, Ireland

Fintan McKiernan

This inventor holds 1 USPTO granted patent. Top assignee: Electro Scientific Industries, Inc.. Active years: 2013.


Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2013

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1 patent (USPTO):Explore Patents

Title: Fintan McKiernan: Innovator in Semiconductor Technology

Introduction

Fintan McKiernan is a notable inventor based in Carrick on Shannon, Ireland. He has made significant contributions to the field of semiconductor technology, particularly in the method of dicing semiconductor wafers. His innovative approach has garnered attention in the industry.

Latest Patents

Fintan McKiernan holds a patent for a method of dicing a semiconductor wafer. This method involves scribing at least one dielectric layer along dice lanes to remove material from the wafer's surface using a laser with a pulse-width between 1 picosecond and 1000 picoseconds. The repetition frequency corresponds to times between pulses that are shorter than the thermal relaxation time of the material being scribed. The wafer is then diced through a metal layer and at least partially through the substrate of the semiconductor wafer. This patent showcases his expertise and innovative thinking in semiconductor processing.

Career Highlights

Fintan McKiernan is currently employed at Electro Scientific Industries, Inc., where he continues to develop cutting-edge technologies in the semiconductor industry. His work has contributed to advancements in manufacturing processes and efficiency.

Collaborations

Fintan has collaborated with notable colleagues such as Adrian Boyle and Joseph Callaghan. Their teamwork has fostered an environment of innovation and creativity within their projects.

Conclusion

Fintan McKiernan is a distinguished inventor whose work in semiconductor technology has made a lasting impact. His patent for dicing semiconductor wafers exemplifies his innovative spirit and dedication to advancing the field.

Profile summary based on public USPTO records.
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