This inventor holds 1 USPTO granted patent and 2 published patent applications and 1 EPO patent. Active years: 2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Years Active: 2026
Title: Innovations by Feng Yuan in Scan Chain Technology
Introduction
Feng Yuan is a notable inventor based in Shenzhen, China. He has made significant contributions to the field of electronic design automation, particularly in the area of scan chain technology. His innovative approach has led to the development of a unique patent that enhances the efficiency of scan chain operations.
Latest Patents
Feng Yuan holds a patent titled "System and method for performing scan chain ECO." This patent outlines a method that includes receiving an original netlist input by a user, which contains original scan chain information. The method further involves receiving a register modification list and a scan DEF file, which indicate register information to be up-chained and/or down-chained. The original netlist is then modified based on this input to complete the up-chaining and/or down-chaining of registers, resulting in a modified scan chain netlist that is returned to the user. Feng Yuan has 1 patent to his name.
Career Highlights
Feng Yuan is currently employed at Byd Company Limited, where he continues to innovate and contribute to advancements in technology. His work focuses on improving electronic design processes, making them more efficient and effective.
Collaborations
Feng Yuan collaborates with talented individuals such as Yu Ye and Xing Wei, who are also part of his team at Byd Company Limited. Their combined expertise fosters a creative environment that drives innovation in their projects.
Conclusion
Feng Yuan's contributions to scan chain technology exemplify the impact of innovative thinking in the field of electronic design automation. His patent and ongoing work at Byd Company Limited highlight his commitment to advancing technology and improving design processes.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile