The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 23, 2026

Filed:

Aug. 19, 2024
Applicant:

Easy-logic Technology (Shenzhen) Co., Ltd., Shenzhen, CN;

Inventors:

Yu Ye, Shenzhen, CN;

Feng Yuan, Shenzhen, CN;

Xing Wei, Shenzhen, CN;

Yi Diao, Shenzhen, CN;

Xiaoqing Yang, Shenzhen, GD;

Linhan Zheng, Shenzhen, CN;

Yibo Wang, Shenzhen, CN;

Xiaoqiang Li, Shenzhen, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 30/333 (2020.01); G06F 30/323 (2020.01); G06F 30/3308 (2020.01); G06F 30/367 (2020.01); G06F 30/398 (2020.01);
U.S. Cl.
CPC ...
G06F 30/333 (2020.01); G06F 30/323 (2020.01); G06F 30/3308 (2020.01); G06F 30/367 (2020.01); G06F 30/398 (2020.01);
Abstract

The present application discloses a system and a method for performing a scan chain ECO, the method includes: receiving an original netlist input by a user as first input information, the original netlist contains original scan chain information; receiving a register modification list and a scan DEF file input by the user as second input information, wherein the register modification list is configured to indicate register information to be up-chained and/or register information to be down-chained; modifying the original netlist based on the first input information and the second input information, to complete up-chaining and/or down-chaining of a list of registers in the second input information to obtain a modified scan chain netlist; and receiving the modified scan chain netlist and returning the modified scan chain netlist to the user.


Find Patent Forward Citations

Ye, Yu. (2026). System and method for performing scan chain eco (U.S. Patent No. 12664343). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12664343

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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