Schifferstadt, Germany

Felix Berkel

This inventor holds 2 USPTO granted patents and 5 published patent applications. Top assignee: Robert Bosch. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Felix Berkel. Retrieved from https://idiyas.com/inventor/felix-berkel

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 2 

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2026

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2 patents (USPTO):Explore Patents

Title: Felix Berkel - Innovator in Machine Learning Systems

Introduction

Felix Berkel is an inventor based in Schifferstadt, Germany. He is known for his contributions to the field of machine learning and control systems. Although he currently holds no granted patents, his innovative ideas are reflected in his latest patent applications.

Latest Patent Applications

Felix Berkel has submitted several notable patent applications. One of his applications is titled "METHOD AND DEVICE FOR TRAINING A MACHINE LEARNING SYSTEM." This application describes a computer-implemented method for training a machine learning system to perform model-predictive control of a technical system. The method involves ascertaining various operating and environmental states of the technical system and training the machine learning system through supervised learning.

Another significant application is "METHOD FOR CALCULATING A PARAMETERIZATION OF A CONTROLLER FOR A TECHNICAL SYSTEM." This method focuses on calculating the parameterization of a controller by determining its characteristics and formulating an optimization problem based on safety and performance requirements. The approach aims to enhance the dynamic behavior of technical systems.

Conclusion

Felix Berkel is an emerging inventor whose work in machine learning and control systems shows great promise. His latest patent applications highlight his innovative approach to solving complex technical challenges.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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