Fei Yeung

Title: Fei Yeung - Innovator in Three-Dimensional Profiling Technology

Introduction

Fei Yeung is a distinguished inventor based in Hong Kong, CN. He has made significant contributions to the field of optical technology, particularly in the development of systems that enhance three-dimensional profiling capabilities. His innovative work has led to the creation of a patented technology that is poised to impact various applications.

Latest Patents

Fei Yeung holds a patent for a "Broadband profiler system and method for constructing a three-dimensional profile of a target." This advanced system incorporates a broadband radiation source and an interferometric system that utilizes beam splitters and reflectors to create a time-delayed optical sample. The system is designed to reconstruct a three-dimensional morphology of the sample by extracting optical path differences, showcasing his expertise in optical engineering.

Career Highlights

Fei Yeung is currently employed at Ap Infosense Limited, where he continues to push the boundaries of technology. His work at the company focuses on developing innovative solutions that leverage his patented technology. His contributions have been instrumental in advancing the capabilities of three-dimensional profiling systems.

Collaborations

Fei Yeung has collaborated with notable colleagues, including Kam Chiu Lau and Yongwoo Park. These partnerships have fostered a collaborative environment that encourages innovation and the sharing of ideas.

Conclusion

Fei Yeung's work in three-dimensional profiling technology exemplifies the spirit of innovation. His patented system represents a significant advancement in optical technology, and his career continues to inspire future developments in the field.