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Title: Fei Li: Innovator in Substrate Processing and Tool Condition Monitoring
Introduction
Fei Li is a prominent inventor based in Cincinnati, OH (US), known for her contributions to substrate processing systems and tool condition monitoring. With a total of 4 patents, she has made significant advancements in her field, showcasing her innovative spirit and technical expertise.
Latest Patents
One of her latest patents is titled "Guardbands in Substrate Processing Systems." This method involves identifying trace data associated with the production of substrates that meet specific property values. The process includes determining a dynamic acceptable area outside of guardband limits and performing corrective actions based on this analysis. Another notable patent is the "Tool Condition Monitoring System," which focuses on monitoring the health condition of tools. This system collects operational data from machines, extracts features, and trains an analytic model to assess the tool's health condition effectively.
Career Highlights
Fei Li has worked with reputable organizations such as Applied Materials, Inc. and the University of Cincinnati. Her experience in these institutions has allowed her to develop and refine her innovative ideas, contributing to advancements in technology and engineering.
Collaborations
Fei has collaborated with notable colleagues, including Jimmy Iskandar and James Robert Moyne, further enhancing her work through shared expertise and insights.
Conclusion
Fei Li's contributions to substrate processing and tool condition monitoring exemplify her innovative capabilities and dedication to her field. Her patents reflect her commitment to advancing technology and improving operational efficiencies.