The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 29, 2025

Filed:

May. 19, 2022
Applicant:

Applied Materials, Inc., Santa Clara, CA (US);

Inventors:

Jimmy Iskandar, Fremont, CA (US);

Fei Li, Cincinnati, OH (US);

James Robert Moyne, Canton, MI (US);

Assignee:

Applied Materials, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G05B 19/418 (2006.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G05B 19/41885 (2013.01); G05B 19/4183 (2013.01); G05B 19/41875 (2013.01); G06N 20/00 (2019.01);
Abstract

A method includes identifying trace data including a plurality of data points, the trace data being associated with production, via a substrate processing system, of substrates that have property values that meet threshold values. The method further includes determining, based on the trace data, a dynamic acceptable area outside of guardband limits. The method further includes causing, based on the dynamic acceptable area outside of the guardband limits, performance of a corrective action associated with the substrate processing system.


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