Ningde, China

Fei Chen

USPTO Granted Patents = 4 

 

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2024-2025

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4 patents (USPTO):Explore Patents

Title: Fei Chen: Innovator in Defect Detection Technology

Introduction

Fei Chen is a prominent inventor based in Ningde, China, known for his contributions to the field of defect detection technology. With a total of 4 patents to his name, Chen has made significant strides in improving the efficiency and accuracy of defect detection processes.

Latest Patents

One of Chen's latest patents is a method and apparatus for detecting defects on the surface of a cell. This innovative approach involves obtaining an initial image of the cell's surface using an image acquisition unit. The initial image is then preprocessed to produce at least one image for defect detection. This image is input into a defect detection neural network model, which outputs a detection result indicating whether a defect is present. The technical solutions proposed by Chen enhance the prominence of defect features in the image, facilitating more effective detection by the neural network model. Additionally, his patent on calibration scale, calibration method, and apparatus outlines a scale body with multiple calibration pattern subsets. These subsets include first calibration blocks arranged in a staggered manner, allowing for improved measurement accuracy.

Career Highlights

Fei Chen has worked with notable companies in the technology sector, including Contemporary Amperex Technology (Hong Kong) Limited and Contemporary Amperex Technology Co., Ltd. His experience in these organizations has contributed to his expertise in developing advanced detection technologies.

Collaborations

Throughout his career, Chen has collaborated with talented individuals such as Guannan Jiang and Guan Chen. These partnerships have played a crucial role in advancing his research and development efforts.

Conclusion

Fei Chen's innovative work in defect detection technology showcases his commitment to enhancing the accuracy and efficiency of detection processes. His contributions are paving the way for advancements in various technological applications.

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