The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 20, 2025
Filed:
Aug. 02, 2023
Applicant:
Contemporary Amperex Technology (Hong Kong) Limited, Hong Kong, CN;
Inventors:
Assignee:
CONTEMPORARY AMPEREX TECHNOLOGY (HONG KONG) LIMITED, Hong Kong, CN;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/80 (2017.01); G03B 35/04 (2021.01); G03B 37/00 (2021.01); G06T 3/40 (2024.01); G06T 3/4038 (2024.01); G06T 5/50 (2006.01); H04N 13/246 (2018.01); H01M 4/04 (2006.01);
U.S. Cl.
CPC ...
G06T 7/85 (2017.01); G03B 35/04 (2013.01); G03B 37/00 (2013.01); G06T 3/40 (2013.01); G06T 3/4038 (2013.01); G06T 5/50 (2013.01); H04N 13/246 (2018.05); G06T 2207/10012 (2013.01); G06T 2207/20221 (2013.01); H01M 4/0404 (2013.01);
Abstract
A calibration scale includes a scale body and at least two calibration pattern subsets arranged on the scale body along a first direction. The at least two calibration pattern subsets include a plurality of first calibration blocks arranged at spacings along the first direction and staggered along a second direction. Projections of the plurality of first calibration blocks in each calibration pattern subset along the first direction have a first overlapping area. Projections of at least two first overlapping areas along the first direction have a second overlapping area.