The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 16, 2025

Filed:

Aug. 07, 2024
Applicant:

Contemporary Amperex Technology (Hong Kong) Limited, Hong Kong, CN;

Inventors:

Lei Zhang, Ningde, CN;

Guannan Jiang, Ningde, CN;

Fei Chen, Ningde, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 17/02 (2006.01); G06T 3/02 (2024.01); G06T 7/13 (2017.01); G06T 7/62 (2017.01); G06T 7/73 (2017.01); H04N 17/00 (2006.01);
U.S. Cl.
CPC ...
G06T 7/74 (2017.01); G06T 3/02 (2024.01); G06T 7/13 (2017.01); G06T 7/62 (2017.01); H04N 17/002 (2013.01); G06T 2207/30108 (2013.01); G06T 2207/30244 (2013.01);
Abstract

Embodiments of this application provide a method and apparatus for testing stability of a vision system, which can test whether the vision system is stable, so as to report a fault in a timely manner when the vision system is unstable, thereby guaranteeing accuracy of a measurement result of the vision system. The method includes: obtaining first position information of a spot inspection piece in a current image under the vision system; performing affine transformation on a reference contour model of the spot inspection piece for a position of the spot inspection piece in the current image based on the first position information, and obtaining, through fitting, a current contour model of the spot inspection piece in the current image based on the reference contour model; and determining stability of the vision system based on the reference contour model and the current contour model.


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