San Marino, CA, United States of America

Fei Chen

This inventor holds 1 USPTO granted patent. Top assignee: California Institute of Technology. Active years: 2007.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Fei Chen. Retrieved from https://idiyas.com/inventor/fei-chen-sbjjm7a4

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 7.0

ph-index = 1

Forward Citations = 10(Granted Patents)


Company Filing History:


Years Active: 2007

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1 patent (USPTO):Explore Patents

Title: Fei Chen: Inventor of Nanocarpets for Particulate Capture

Introduction

Fei Chen is an inventor associated with San Marino, California, and the California Institute of Technology. His listed patent work concerns a nanofeature-based technology designed to trap particulates, bacteria, and spores.

Latest Patents

Chen is credited with 1 patent: “Nanocarpets for Trapping Particulates, Bacteria and Spores.” The invention describes a particulate trap made from densely packed nanofeatures, such as nanotubes, and a particulate detector incorporating the trap. It also outlines methods for producing the nanotrap structure either on its own or integrated with a detector.

Career Highlights

The patent connects Chen’s work with the California Institute of Technology and highlights an approach to particulate capture that uses nanoscale structures. The proposed technology combines a nanofeature trap with the option of detecting captured particles.

Collaborations

The provided information lists Daniel Choi and Flavio Noca as Chen’s coworkers. Their specific roles in the patent or related research are not specified.

Conclusion

Fei Chen’s listed invention applies densely packed nanofeatures to trapping particulates, bacteria, and spores, reflecting a research focus associated with the California Institute of Technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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