The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 13, 2007

Filed:

Jun. 06, 2003
Applicants:

Flavio Noca, Altadena, CA (US);

Brian D. Hunt, La Crescenta, CA (US);

Michael J. Bronikowski, Altadena, CA (US);

Michael E. Hoenk, Valencia, CA (US);

Robert S. Kowalczyk, Santa Clarita, CA (US);

Daniel S. Choi, Los Angeles, CA (US);

Fei Chen, San Marino, CA (US);

Inventors:

Flavio Noca, Altadena, CA (US);

Brian D. Hunt, La Crescenta, CA (US);

Michael J. Bronikowski, Altadena, CA (US);

Michael E. Hoenk, Valencia, CA (US);

Robert S. Kowalczyk, Santa Clarita, CA (US);

Daniel S. Choi, Los Angeles, CA (US);

Fei Chen, San Marino, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B01D 46/50 (2006.01); B01D 63/00 (2006.01); B01D 57/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

A nanofeature particulate trap comprising a plurality of densely packed nanofeatures, such as nanotubes, and a particulate detector incorporating the nanofeature particulate trap are provided. A method of producing a nanotrap structure alone or integrated with a particulate detector is also provided.


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