This inventor holds 2 USPTO granted patents. Top assignee: Lsi Logic Corporation. Active years: 2003-2004.
Location History:
- Roslindale, MA (US) (2003)
- Rolindale, MA (US) (2004)
Company Filing History:
Years Active: 2003-2004
Title: The Innovative Contributions of Farzin Karimi
Introduction
Farzin Karimi is a notable inventor based in Roslindale, MA (US). He has made significant contributions to the field of integrated circuit technology, holding 2 patents that showcase his innovative approach to memory testing and built-in self-test (BIST) methodologies.
Latest Patents
Karimi's latest patents include advancements in parallel testing of multiport memory. This invention discloses a multiport BIST method and apparatus that adapts a single port BIST method by dividing memory into sections based on the number of ports. The method allows for simultaneous testing through all ports, enhancing efficiency in memory verification. Another significant patent involves the use of a scan chain for configuring BIST unit operations. This integrated circuit device features a boundary scan chain and a hardwired BIST unit, which can be configured via control circuitry, ensuring effective testing of application logic.
Career Highlights
Farzin Karimi has built a successful career at LSI Logic Corporation, where he has applied his expertise in integrated circuit design and testing. His work has contributed to the development of reliable and efficient memory systems, which are crucial in modern computing.
Collaborations
Throughout his career, Karimi has collaborated with talented professionals, including Thompson W Crosby and V Swamy Irrinki. These collaborations have fostered an environment of innovation and have led to the successful development of advanced technologies.
Conclusion
Farzin Karimi's contributions to the field of integrated circuits and memory testing are noteworthy. His patents reflect a commitment to innovation and excellence in technology.