Kamisato, Japan

Fariz Bin Abdulrashid

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Hitachi-High-Technologies Corporation. Active years: 2014.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Fariz Bin Abdulrashid. Retrieved from https://idiyas.com/inventor/fariz-bin-abdulrashid

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2014

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1 patent (USPTO):Explore Patents

Title: Fariz Bin Abdulrashid: Innovator in Disk Surface Inspection Technology

Introduction

Fariz Bin Abdulrashid is a notable inventor based in Kamisato-machi, Japan. He has made significant contributions to the field of disk surface inspection technology. His innovative approach has led to the development of a unique method for detecting surface defects on disks.

Latest Patents

Fariz holds 1 patent for his invention titled "Method and apparatus for inspecting surface of a disk." This patent describes a disk surface inspection method that effectively detects circle scratch defects, distinguishing them from sporadically existing scratch defects. The method involves irradiating the sample with light, detecting regular reflection light, and separately detecting scattered light. By processing these signals, the method identifies defect candidates and extracts circumferential defects based on specific ratios.

Career Highlights

Fariz is currently employed at Hitachi High-Technologies Corporation, where he continues to advance his research and development efforts. His work has been instrumental in enhancing the quality control processes in disk manufacturing.

Collaborations

Fariz collaborates with talented coworkers, including Yu Yanaka and Kiyotaka Horie. Their combined expertise contributes to the innovative projects at Hitachi High-Technologies Corporation.

Conclusion

Fariz Bin Abdulrashid is a pioneering inventor whose work in disk surface inspection technology has made a significant impact in the industry. His innovative methods and collaborative efforts continue to drive advancements in quality control processes.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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