Yantai, China

Fangfang Sun

This inventor holds 1 USPTO granted patent. Top assignee: Remegen Co., Ltd.. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Fangfang Sun. Retrieved from https://idiyas.com/inventor/fangfang-sun-06l1ffkl

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Fangfang Sun - Innovator in ADC Detection Methods

Introduction

Fangfang Sun is a notable inventor based in Yantai, China. She has made significant contributions to the field of analytical chemistry, particularly in the detection of DTPA content in antibody-drug conjugates (ADCs). Her innovative approach has the potential to enhance the efficiency and reliability of DTPA detection methods.

Latest Patents

Fangfang Sun holds a patent titled "Method for detecting DTPA content in ADC by LC-MS/MS." This method involves the derivatization of samples with Fe under weak alkaline conditions, utilizing a weak alkaline mobile phase without the need for ion-pair reagents. The method is characterized by high efficiency, stability, and durability, addressing the limitations of existing DTPA detection methods.

Career Highlights

Fangfang Sun is currently associated with Remegen Co., Ltd., where she applies her expertise in analytical methods. Her work has contributed to advancements in the pharmaceutical industry, particularly in the development of ADCs.

Collaborations

Fangfang collaborates with talented individuals such as Xuejing Yao and Wenlong Sun, who contribute to her research and development efforts.

Conclusion

Fangfang Sun's innovative methods in DTPA detection represent a significant advancement in analytical chemistry. Her contributions are poised to make a lasting impact in the field of pharmaceutical research and development.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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