Santa Clara, CA, United States of America

Fahim Al Hasnaeen

This inventor holds 1 USPTO granted patent. Top assignee: Intel Corporation. Active years: 2019.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Fahim Al Hasnaeen. Retrieved from https://idiyas.com/inventor/fahim-al-hasnaeen

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2019

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1 patent (USPTO):Explore Patents

Title: Fahim Al Hasnaeen: Innovator in Portable Electronic Measurement Devices

Introduction

Fahim Al Hasnaeen is a notable inventor based in Santa Clara, California. He has made significant contributions to the field of electronic measurement devices. His innovative work has led to the development of a portable electronic measurement device, showcasing his expertise and creativity in technology.

Latest Patents

Fahim holds 1 patent for his invention of a portable electronic measurement device. This invention reflects his commitment to advancing technology and improving measurement accuracy in various applications.

Career Highlights

Fahim is currently employed at Intel Corporation, a leading technology company known for its innovations in computing and electronics. His role at Intel allows him to work on cutting-edge projects that push the boundaries of technology.

Collaborations

Fahim has collaborated with talented coworkers, including Narayan Sundararajan and Grace M Credo. These collaborations have likely contributed to the success of his projects and innovations.

Conclusion

Fahim Al Hasnaeen is a dedicated inventor whose work in portable electronic measurement devices exemplifies his innovative spirit. His contributions to Intel Corporation and the field of technology are commendable and highlight the importance of creativity in engineering.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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