This inventor holds 3 USPTO granted patents. Top assignee: Olympus Optical Company, Ltd.. Active years: 1992-1993.
Company Filing History:
Years Active: 1992-1993
Title: Etsuo Shinohara: Innovator in Scanning Probe Microscopy
Introduction
Etsuo Shinohara is a notable inventor based in Hachioji, Japan. He has made significant contributions to the field of scanning probe microscopy and semiconductor technology. With a total of 3 patents, his work has advanced the capabilities of various scientific instruments.
Latest Patents
Shinohara's latest patents include a cantilever for a scanning probe microscope and a method of manufacturing it. This cantilever comprises a lever section and a probe section located near the free end. The probe section features a conical distal end portion with a narrow point angle and a bulging proximal end portion that is continuous with the distal end. The manufacturing process utilizes semiconductor technology, showcasing his innovative approach. Another patent involves an FET sensor apparatus of flow-cell adaptive type. This apparatus includes a sensor, a base member, and a support. The sensor is built on a semiconductor substrate with a predetermined crystal plane, featuring a field-effect transistor and a gate portion arranged on the substrate's major surfaces.
Career Highlights
Etsuo Shinohara is currently employed at Olympus Optical Company, Ltd., where he continues to develop cutting-edge technologies. His work has been instrumental in enhancing the functionality and precision of optical instruments.
Collaborations
Shinohara has collaborated with notable colleagues such as Kiyozou Koshiishi and Kaoru Tadokoro. Their combined expertise has contributed to the success of various projects within the company.
Conclusion
Etsuo Shinohara's innovative contributions to scanning probe microscopy and semiconductor technology highlight his role as a leading inventor in his field. His patents reflect a commitment to advancing scientific instrumentation, making a lasting impact on technology.