Olympus Optical Company, Ltd.

Etsuo Shinohara

Kiyozou Koshiishi

Akitoshi Toda

Michio Takayama

Yasuji Nagata

Kaoru Tadokoro

Yoshimitsu Enomoto

Masatsugu Shimomura

Ryo Ohta

A cantilever for a scanning probe microscope comprises a lever section and a probe section disposed near the free end thereof. The probe section includes a conical distal end portion having a narrow point angle and a bulging proximal end portion continuous with the distal end portion. The cantilever is manufactured by utilizing a semiconductor process.

Cantilever for a scanning probe microscope and a method of manufacturing

An FET sensor apparatus comprising a sensor, a base member, and a support. The sensor comprises a semiconductor substrate having a predetermined crystal plane, a field-effect transistor formed on the semiconductor substrate, and a gate portion arranged on at least one of the major surfaces of the semiconductor substrate. The base member has a through hole in which the field-effect transistor is fitted. The support supports the sensor in the through hole in watertight fashion, with said gate portion exposed through an end of the hole.

FET sensor apparatus of flow-cell adaptive type and method of

An optical sensor for detecting a specific substance in a solution, based on optical changes, includes a substrate and a thin membrane formed on the substrate. The membrane is formed of an ion complex material of an ionic amphipathic compound with a polymer having ionic groups of the opposite electrical charge, a potential-sensitive dye and a substance-selective compound.

Optical sensor

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Hachioji, Japan

Etsuo Shinohara