Atsugi, Japan

Etsuji Mesuda

This inventor holds 2 USPTO granted patents. Top assignee: Anritsu Corporation. Active years: 1996-1997.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Etsuji Mesuda. Retrieved from https://idiyas.com/inventor/etsuji-mesuda

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 2

Forward Citations = 26(Granted Patents)


Company Filing History:


Years Active: 1996-1997

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2 patents (USPTO):Explore Patents

Title: Etsuji Mesuda: Patents in Signal Modulation and Jitter Detection.

Introduction

Etsuji Mesuda is an inventor associated with Anritsu Corporation and based in Atsugi, Japan. His listed patent work addresses signal modulation and the measurement of jitter in frequency-conversion systems. He is credited with 2 patents.

Latest Patents

**Phase Modulator Capable of Individually Defining Modulation Degree.** This invention describes a system that generates a phase-modulated signal using frequency modulation, mixing, and a delay circuit. Its design allows the modulation degree and modulation frequency to be set across wide ranges.

**Jitter Detection Apparatus Using Double-PLL Structure.** This apparatus uses a frequency converter and a double-PLL arrangement to detect jitter in a target signal. By extracting jitter components outside the loop’s frequency band, it is designed to support stable, accurate measurements even when the target signal undergoes substantial frequency changes.

Career Highlights

Mesuda’s listed inventions focus on signal-processing technologies relevant to communications and measurement equipment. His work at Anritsu Corporation connects his patent record with the company’s engineering activities.

Collaborations

Mesuda’s listed coworkers include Osamu Tagiri and Kazuhiko Ishibe.

Conclusion

Etsuji Mesuda’s two listed patents highlight his contributions to phase modulation and jitter detection, reflecting a focus on precise signal generation and measurement.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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