Munich, Germany

Ernst Müllner

This inventor holds 1 USPTO granted patent. Top assignee: Siemens Aktiengesellschaft. Active years: 2005.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ernst Müllner. Retrieved from https://idiyas.com/inventor/ernst-müllner

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 12(Granted Patents)


Company Filing History:


Years Active: 2005

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1 patent (USPTO):Explore Patents

Title: The Innovations of Ernst Müllner

Introduction

Ernst Müllner is a notable inventor based in Munich, Germany. He has made significant contributions to the field of optical transmission systems. His work focuses on improving signal quality, which is crucial for effective communication technologies.

Latest Patents

Müllner holds a patent for a "Method and arrangement for measuring the signal quality in an optical transmission system." This innovative approach involves sampling a received binary signal with different thresholds. The sampling results are then integrated and stored. The measured probability distributions can be utilized to assess signal quality, such as the bit error rate, and to optimize the overall system performance. He has 1 patent to his name.

Career Highlights

Ernst Müllner is associated with Siemens Aktiengesellschaft, a leading global technology company. His role at Siemens has allowed him to work on cutting-edge technologies and contribute to advancements in optical communication.

Collaborations

Müllner has collaborated with esteemed colleagues, including Rainer Wiesmann and Christoph Glingener. Their combined expertise has fostered innovation and development in their respective fields.

Conclusion

Ernst Müllner's contributions to optical transmission systems exemplify the importance of innovation in technology. His patent reflects a commitment to enhancing communication systems, showcasing the impact of dedicated inventors in the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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