The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 22, 2005

Filed:

Mar. 01, 2000
Applicants:

Rainer Wiesmann, Geltendorf, DE;

Christoph Glingener, Feldkirchen-Westerham, DE;

Oliver Bleck, München, DE;

Björn Heppner, München, DE;

Ernst Müllner, München, DE;

Albrecht Neudecker, München, DE;

Inventors:

Rainer Wiesmann, Geltendorf, DE;

Christoph Glingener, Feldkirchen-Westerham, DE;

Oliver Bleck, München, DE;

Björn Heppner, München, DE;

Ernst Müllner, München, DE;

Albrecht Neudecker, München, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04B007/212 ;
U.S. Cl.
CPC ...
Abstract

A received binary signal (BS) is sampled with different thresholds, the sampling results are integrated and stored. The measured probability distributions or probability density distributions can be used to draw conclusions concerning the signal quality (for example, the bit error rate) and to optimize the system.


Find Patent Forward Citations

Wiesmann, Rainer. (2005). Method and arrangement for measuring the signal quality in an optical transmission system (U.S. Patent No. 6968134). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6968134

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…