Tokyo, Japan

Erika Narata

This inventor holds 1 USPTO granted patent. Top assignee: Hitachi, Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Erika Narata. Retrieved from https://idiyas.com/inventor/erika-narata

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Erika Narata and an Automated Screen-Testing Invention.

Introduction

Erika Narata is an inventor associated with Hitachi, Ltd. in Tokyo, Japan. Her patent work addresses automated testing of screen-based systems, with the aim of identifying defects while reducing the need for manual review.

Latest Patents

Narata is credited with 1 patent: “Automatic Screen Operation Test Support Apparatus and Automatic Screen Operation Test Support Method.” The invention records differences between screens captured during repeated automated tests of the same system, creating a reference list of differences that are not defects. It then compares screens from a reference system and a target system, excluding known non-defect differences to help identify potentially problematic defects.

Career Highlights

The patent reflects work on improving the efficiency and reliability of automated screen-operation testing. By distinguishing expected variations from potentially meaningful differences, the approach is designed to support defect detection without requiring manual comparison of every captured screen.

Collaborations

The supplied information associates Narata’s patent with Hitachi, Ltd. It does not specify additional collaborators or describe her role at the company.

Conclusion

Erika Narata’s documented invention focuses on making automated screen testing more practical by filtering out known non-defect differences and helping surface potential defects.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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