The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 20, 2026
Filed:
Sep. 05, 2024
Automatic screen operation test support apparatus and automatic screen operation test support method
Hitachi, Ltd., Tokyo, JP;
Erika Narata, Tokyo, JP;
Naoki Utsunomiya, Tokyo, JP;
Shingo Katano, Tokyo, JP;
Keisuke Fukumoto, Tokyo, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
Provided are an automatic screen operation test support apparatus and an automatic screen operation test support method capable of extracting a problematic defect difference in an automatic screen operation test of a screen system without requiring manual work. The automatic screen operation test support apparatus executes non-defect list creation processing of recording, in a non-defect difference information table, a difference between captured screens caused by executing an automatic screen operation test a plurality of times on the same screen system. The automatic screen operation test support apparatus executes defect difference checking processing of specifying a non-defect difference by excluding a non-defect difference from differences between captured screens caused by executing the automatic screen operation test on a comparison reference screen system and a comparison target screen system.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile