Erik Michiel Franken

Title: The Innovative Mind of Erik Michiel Franken

Introduction

Erik Michiel Franken, hailing from Eindhoven, Netherlands, is a prominent inventor in the field of charged particle beam technology. With an impressive portfolio of 15 patents, Franken has made significant contributions to advancements in the field, particularly in imaging systems that leverage charged particle beams.

Latest Patents

Among his latest notable patents are:

1. **Rotating Sample Holder for Random Angle Sampling in Tomography**: This innovative sample holder retains a sample and allows for continuous rotation in a single direction while the sample is exposed to a charged particle beam (CPB) or other radiation sources. The CPB is typically strobed to generate a series of images at random or arbitrary angles of rotation, which are then utilized in tomographic reconstruction processes. Notably, the device can rotate more than one complete revolution of the sample, and intriguing uses exist for relative rotation angles in reconstructions.

2. **Measurement and Correction of Optical Aberrations in Charged Particle Beam Microscopy**: This patent focuses on a method for operating a charged particle beam microscope system in transmission imaging mode. During imaging, the system applies a time series of beam tilts to direct the charged particle beam towards the sample, producing a sequence of images. Throughout this process, at least some images are captured while transitioning between beam tilts, allowing for the identification and correction of optical aberrations within the microscope system.

Career Highlights

Erik Michiel Franken's career has been marked by his work at Fei Company, where he has leveraged his expertise in charged particle beam technology. His dedication to innovation has positioned him as a notable figure in the field, driving forward research and development in advanced imaging techniques.

Collaborations

Franken collaborates with other skilled professionals, including Bart Jozef Janssen and Yuchen Deng. Together, they form a dynamic team that contributes to groundbreaking innovations and further enhances the company's research capabilities.

Conclusion

Erik Michiel Franken stands out as a distinguished inventor whose patents reflect his commitment to enhancing the functionality and precision of charged particle beam systems. His ongoing innovations not only impact the field of microscopy but also pave the way for future technological advancements. With a strong foundation in research and a collaborative spirit, Franken continues to significantly influence the world of scientific imaging.