Mercer Island, WA, United States of America

Erik Meijer

This inventor holds 23 USPTO granted patents and 5 published patent applications and 1 EPO patent, primarily in Data Processing Techniques. Top assignee: Microsoft Technology Licensing, LLC. Active years: 2006-2017.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Erik Meijer. Retrieved from https://idiyas.com/inventor/erik-meijer

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 23 

% Patents Active = 52.2


Average Co-Inventor Count = 3.7

ph-index = 8

Forward Citations = 223(Granted Patents)


Company Filing History:


Years Active: 2006-2017

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Areas of Expertise:
Automated Client/Server Partitioning
Dataset Transformation
Fuzz Testing
Data Query Translation
Query Processing
Object-Oriented Programming
Mobile Sensor Network
Lightweight Runtime Code Generation
Dynamic Runtime Environment
Type System
Batch Processing
23 patents (USPTO):Explore Patents

Title: The Innovative Mind of Erik Meijer

Introduction: Erik Meijer, a talented inventor hailing from Mercer Island, WA, is known for his groundbreaking contributions to the world of technology and innovation.

Latest Patents: Erik Meijer holds several patents in the field of software development and programming languages, showcasing his expertise and creativity in this domain.

Career Highlights: With a successful career spanning over two decades, Erik Meijer has worked with renowned tech companies, leading research institutions, and universities, leaving a lasting impact on the industry.

Collaborations: Throughout his career, Erik Meijer has collaborated with top-notch engineers, developers, and researchers, fostering a culture of innovation and excellence in all his projects.

Conclusion: Erik Meijer's passion for innovation and his relentless pursuit of excellence continue to inspire aspiring inventors and tech enthusiasts around the globe.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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