The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 26, 2014

Filed:

Jun. 24, 2008
Applicants:

Matthew J. Warren, Redmond, WA (US);

Anders Hejlsberg, Seattle, WA (US);

Ion Vasilian, Seattle, WA (US);

Erik Meijer, Mercer Island, WA (US);

Dinesh C. Kulkarni, Seattle, WA (US);

Inventors:

Matthew J. Warren, Redmond, WA (US);

Anders Hejlsberg, Seattle, WA (US);

Ion Vasilian, Seattle, WA (US);

Erik Meijer, Mercer Island, WA (US);

Dinesh C. Kulkarni, Seattle, WA (US);

Assignee:

Microsoft Corporation, Redmond, WA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
G06F 17/30451 (2013.01);
Abstract

Data source queries may be specified in various languages, such as SQL, XQuery, and object-oriented languages, and each language may have various linguistic features that enable different types of queries. It may be advantageous to formulate mixed language queries having portions specified in a first language and portions specified in a second language, and to provide mixed language query evaluation components that can parse portions of queries of different languages. It may also be advantageous to permit the translation of single language queries into multiple languages to be parsed by such mixed language query evaluation components. Such techniques may permit queries to utilize linguistic features and processing techniques of one language that are less efficient, less direct, or simply unavailable in another language.


Find Patent Forward Citations

Loading…