Pflach, Austria

Erich Kny

This inventor holds 1 USPTO granted patent. Top assignee: Schwarzkopf Development Corporation. Active years: 1988.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Erich Kny. Retrieved from https://idiyas.com/inventor/erich-kny-rdwzis3b

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1

Forward Citations = 13(Granted Patents)


Company Filing History:


Years Active: 1988

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1 patent (USPTO):Explore Patents

Title: Erich Kny: Innovator in Sputter Target Technology

Introduction

Erich Kny is a notable inventor based in Pflach, Austria. He has made significant contributions to the field of materials science, particularly in the development of sputter targets. His innovative work has led to advancements that are crucial for various industrial applications.

Latest Patents

Kny holds a patent for a "Sputter target and process for producing sputter target." This invention involves sputter targets made from carbides, nitrides, and borides of refractory metals. The process begins with the creation of a dense composite body that includes these materials along with a metallic binding agent from the iron group of the periodic table. The resulting sputter target exhibits excellent mechanical strength and high thermal shock resistance, with minimal levels of contaminating elements.

Career Highlights

Erich Kny is associated with Schwarzkopf Development Corporation, where he applies his expertise in materials science. His work has been instrumental in enhancing the performance and reliability of sputter targets used in various applications.

Collaborations

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Conclusion

Erich Kny's contributions to sputter target technology exemplify the impact of innovative thinking in materials science. His patent reflects a commitment to quality and performance in industrial applications.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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