Company Filing History:
Years Active: 2013
Title: Erich Henjes: Innovator in Non-Destructive Inspection Technology
Introduction
Erich Henjes is a notable inventor based in Newton, MA (US). He has made significant contributions to the field of non-destructive inspection technology. His innovative work has led to the development of a unique patent that enhances the visualization of waveform displays.
Latest Patents
Henjes holds a patent for a "Peak visualization enhancement display system for use with a compressed waveform display on a non-destructive inspection instrument." This system replicates the haloing effect of analog cathode ray tube (CRT) displays. It employs a peak detection algorithm that intelligently selects peak values from within the uncompressed digitized waveform. This algorithm effectively prevents noise spikes from being misidentified as valid waveform peaks. The digital display highlights the identified peaks on the compressed waveform display, thereby replicating the bright spots typically seen on analog CRT displays.
Career Highlights
Erich Henjes has worked at Olympus NDT, where he has applied his expertise in developing advanced inspection technologies. His work has been instrumental in improving the accuracy and reliability of non-destructive testing methods.
Collaborations
Henjes has collaborated with notable colleagues, including Andrew Thomas and Steven Besser. Their combined efforts have contributed to advancements in the field of non-destructive inspection.
Conclusion
Erich Henjes is a distinguished inventor whose work in non-destructive inspection technology has made a lasting impact. His innovative patent demonstrates his commitment to enhancing the capabilities of inspection instruments.