Eric R Westphal

Title: The Innovative Journey of Eric R. Westphal

Introduction

Eric R. Westphal is an accomplished inventor based in West Lafayette, Indiana. He holds one patent that reflects his expertise in x-ray fluorescence technology, demonstrating his significant contributions to the field of material science and temperature measurement.

Latest Patents

Westphal's notable patent is for a system and method titled "Temperature Dependent X-Ray Fluorescence." This innovative technology involves using an x-ray source to irradiate a sample of material. The resulting photon fluorescence produced by the sample in response to this irradiation is then detected by multiple photon detectors. Through this process, the temperature of the sample can be accurately determined based on a predefined relationship between the photon fluorescence and the temperature of the material.

Career Highlights

Throughout his career, Eric R. Westphal has worked with renowned organizations. He has gained valuable experience at National Technology & Engineering Solutions of Sandia, LLC, and the University of Texas System. His work at these institutions has allowed him to develop and refine his unique approach to temperature detection using x-ray fluorescence.

Collaborations

Westphal has collaborated with talented individuals in his field, including Kathryn N. Gabet Hoffmeister and Enrico C. Quintana. These partnerships have propelled his research forward and fostered innovations that contribute to advancements in scientific knowledge.

Conclusion

Eric R. Westphal's inventive spirit and dedication to improving temperature measurement techniques through x-ray fluorescence reflect the essence of innovation. His patent not only showcases his skills as an inventor but also highlights the potential applications of his work in various industries, paving the way for further advancements in technology.