The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 03, 2021

Filed:

Oct. 24, 2019
Applicants:

National Technology & Engineering Solutions of Sandia, Llc, Albuquerque, NM (US);

Steven F. Son, West Lafayette, IN (US);

Eric R. Westphal, West Lafayette, IN (US);

Inventors:

Kathryn N. Gabet Hoffmeister, Albuquerque, NM (US);

Enrico C. Quintana, Albuquerque, NM (US);

Walter Gill, Albuquerque, NM (US);

Steven F. Son, West Lafayette, IN (US);

Eric R. Westphal, West Lafayette, IN (US);

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01K 11/30 (2006.01); G01N 23/223 (2006.01);
U.S. Cl.
CPC ...
G01K 11/30 (2013.01); G01N 23/223 (2013.01); G01N 2223/40 (2013.01);
Abstract

A method and system for determining temperature are provided. The method comprises using an x-ray source to irradiate a sample of a material with x-rays. Photon fluorescence produced by the sample in response to the x-ray irradiation is detected by a number of photon detectors. Based on the detected fluorescence a temperature of the sample is determined according to a predetermined relationship between photon fluorescence and temperature for the material.


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