Tainan, Taiwan

Eric Pei

This inventor holds 1 USPTO granted patent. Top assignee: Applied Materials, Inc.. Active years: 2012.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Eric Pei. Retrieved from https://idiyas.com/inventor/eric-pei

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 9.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2012

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1 patent (USPTO):Explore Patents

Title: The Innovations of Eric Pei

Introduction

Eric Pei is a notable inventor based in Tainan, Taiwan. He has made significant contributions to the field of semiconductor technology. His work focuses on methods for fabricating advanced semiconductor devices.

Latest Patents

Eric Pei holds a patent titled "Method for fabricating a semiconductor device having a lanthanum-family-based oxide layer." This patent describes innovative methods for creating a gate stack with a lanthanum-family-based oxide layer above a substrate. The process includes modifying a portion of the oxide layer to form a lanthanum-family-based halide portion, which is then removed using a water vapor treatment. He has 1 patent to his name.

Career Highlights

Eric Pei is currently employed at Applied Materials, Inc., a leading company in the semiconductor industry. His expertise in semiconductor fabrication has positioned him as a valuable asset to his team. He has worked alongside talented colleagues, including Meihua Shen and Noel Sun.

Collaborations

Due to space constraints, the collaborations section will be omitted.

Conclusion

Eric Pei's innovative work in semiconductor technology exemplifies the advancements being made in this critical field. His contributions continue to influence the development of modern electronic devices.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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