This inventor holds 1 USPTO granted patent and 3 published patent applications. Top assignee: Andersen Corporation. Active years: 2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2026
Title: Eric Lee Ottem and Fenestration Measurement Innovation.
Introduction
Eric Lee Ottem is an inventor based in River Falls, Wisconsin. His patent work includes a system designed to support the measurement of existing windows and other fenestration units for replacement and installation.
Latest Patents
Ottem is associated with 1 patent: “Advanced Measuring Tool for Fenestration Replacements and Installation.” The invention describes a measuring system that uses a solid-object sensor connected to a control circuit to detect physical features of an existing fenestration unit. The system uses those features to measure dimensions and estimate the dimensions needed for a replacement. The patent also describes systems for measuring fenestration-receiving apertures.
Career Highlights
Ottem is associated with Andersen Corporation. His patented work addresses a practical challenge in fenestration replacement: obtaining measurements that can help determine the dimensions required for a new unit.
Collaborations
Jeff Lien is identified as Ottem’s coworker. The available information does not specify their roles or describe a particular joint project.
Conclusion
Eric Lee Ottem’s patent focuses on sensor-assisted measurement for fenestration replacement and installation, connecting his work with Andersen Corporation to a practical application in the window industry.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile