The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 29, 2026

Filed:

Jun. 21, 2023
Applicant:

Andersen Corporation, Bayport, MN (US);

Inventors:

Jeff Lien, Clayton, WI (US);

Arik Van Asten, Minneapolis, MN (US);

Eric Lee Ottem, River Falls, WI (US);

Assignee:

Andersen Corporation, Bayport, MN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/62 (2017.01); E06B 1/02 (2006.01); G01C 11/10 (2006.01);
U.S. Cl.
CPC ...
G06T 7/62 (2017.01); G01C 11/10 (2013.01); E06B 1/02 (2013.01); G06T 2207/10024 (2013.01);
Abstract

Embodiments herein relate to fenestration replacement measuring systems and fenestration receiving aperture measuring systems. In a first aspect, a fenestration replacement measuring system is included having a control circuit, and a solid object sensor, wherein the solid object sensor can be in electrical communication with the control circuit. The fenestration replacement measuring system can be configured to detect physical features of an existing fenestration unit using data from the solid object sensor, measure one or more dimensions of the existing fenestration unit using the physical features, and estimate one or more dimensions needed for fenestration replacement using the measured dimensions. Other embodiments are also included herein.


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