Palo Alto, CA, United States of America

Eric J Soderstrom

This inventor holds 1 USPTO granted patent. Top assignee: Revera, Incorporated. Active years: 2008.


Average Co-Inventor Count = 1.0

ph-index = 1

Forward Citations = 10(Granted Patents)


Company Filing History:


Years Active: 2008

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1 patent (USPTO):Explore Patents

Title: Innovations of Eric J Soderstrom in Photoelectron Spectroscopy

Introduction

Eric J Soderstrom is an accomplished inventor based in Palo Alto, CA. He has made significant contributions to the field of photoelectron spectroscopy, particularly through his innovative methods for calibrating multiple systems. His work is characterized by a focus on enhancing the accuracy and reliability of spectral data analysis.

Latest Patents

Eric J Soderstrom holds a patent for a method titled "Calibrating multiple photoelectron spectroscopy systems." This patent involves obtaining a first set of spectral data for a sample film measured by a first system. The process includes extracting intensities for elemental species associated with the sample film and determining quantitative characteristics based on these intensities. The method further involves obtaining a second set of spectral data for a comparable sample film and continually adjusting the extraction function to ensure that the quantitative characteristics closely match.

Career Highlights

Eric is currently associated with Revera, Incorporated, where he applies his expertise in photoelectron spectroscopy. His innovative approach has led to advancements in the calibration of spectroscopy systems, which are crucial for accurate material analysis in various scientific fields. His patent reflects his commitment to improving measurement techniques and enhancing the understanding of material properties.

Conclusion

Eric J Soderstrom's contributions to photoelectron spectroscopy through his innovative patent demonstrate his dedication to advancing scientific methodologies. His work continues to influence the field and improve the accuracy of spectral data analysis.

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